IOLTS
2007
IEEE
13 years 11 months ago
2007
IEEE
i To boost logic density and reduce per unit power consumption SRAM-based FPGAs manufacturers adopted nanometric technologies. However, this technology is highly vulnerable to radi...
IOLTS
2007
IEEE
13 years 11 months ago
2007
IEEE
IOLTS
2007
IEEE
13 years 11 months ago
2007
IEEE
Security of cryptographic circuits is a major concern. Fault attacks are a mean to obtain critical information with the use of physical disturbance and cryptanalysis. We propose a...
IOLTS
2007
IEEE
13 years 11 months ago
2007
IEEE
In this paper we present an efficient design technique for implementing the Elliptic Curve Cryptographic (ECC) Scheme in FPGAs. Our technique is based on a novel and efficient i...
IOLTS
2007
IEEE
13 years 11 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
IOLTS
2007
IEEE
13 years 11 months ago
2007
IEEE
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...
IOLTS
2007
IEEE
13 years 11 months ago
2007
IEEE