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IOLTS
2007
IEEE
124views Hardware» more  IOLTS 2007»
9 years 9 months ago
On-Line Self-Healing of Circuits Implemented on Reconfigurable FPGAs
i To boost logic density and reduce per unit power consumption SRAM-based FPGAs manufacturers adopted nanometric technologies. However, this technology is highly vulnerable to radi...
Manuel G. Gericota, Luís F. Lemos, Gustavo ...
IOLTS
2007
IEEE
112views Hardware» more  IOLTS 2007»
9 years 9 months ago
Tolerance to Small Delay Defects by Adaptive Clock Stretching
Swaroop Ghosh, Patrick Ndai, Swarup Bhunia, Kaushi...
IOLTS
2007
IEEE
98views Hardware» more  IOLTS 2007»
9 years 9 months ago
Robustness of circuits under delay-induced faults : test of AES with the PAFI tool
Security of cryptographic circuits is a major concern. Fault attacks are a mean to obtain critical information with the use of physical disturbance and cryptanalysis. We propose a...
Olivier Faurax, Assia Tria, Laurent Freund, Fr&eac...
IOLTS
2007
IEEE
110views Hardware» more  IOLTS 2007»
9 years 9 months ago
An Elliptic Curve Cryptosystem Design Based on FPGA Pipeline Folding
In this paper we present an efficient design technique for implementing the Elliptic Curve Cryptographic (ECC) Scheme in FPGAs. Our technique is based on a novel and efficient i...
Osama Al-Khaleel, Christos A. Papachristou, Franci...
IOLTS
2007
IEEE
120views Hardware» more  IOLTS 2007»
9 years 9 months ago
Accelerating Soft Error Rate Testing Through Pattern Selection
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
IOLTS
2007
IEEE
155views Hardware» more  IOLTS 2007»
9 years 9 months ago
On Derating Soft Error Probability Based on Strength Filtering
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...
Alodeep Sanyal, Sandip Kundu
IOLTS
2007
IEEE
88views Hardware» more  IOLTS 2007»
9 years 9 months ago
Automated Derivation of Application-aware Error Detectors using Static Analysis
Karthik Pattabiraman, Zbigniew Kalbarczyk, Ravisha...
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