Sciweavers

ISQED
2007
IEEE
148views Hardware» more  ISQED 2007»
13 years 11 months ago
On Accelerating Soft-Error Detection by Targeted Pattern Generation
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
ISQED
2007
IEEE
124views Hardware» more  ISQED 2007»
13 years 11 months ago
Multi-Dimensional Circuit and Micro-Architecture Level Optimization
This paper studies multi-dimensional optimization at both circuit and micro-architecture levels. By formulating and solving the optimization problem with conflicting design objec...
Zhenyu Qi, Matthew M. Ziegler, Stephen V. Kosonock...
ISQED
2007
IEEE
136views Hardware» more  ISQED 2007»
13 years 11 months ago
A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology
Choongyeun Cho, Daeik D. Kim, Jonghae Kim, Jean-Ol...
ISQED
2007
IEEE
197views Hardware» more  ISQED 2007»
13 years 11 months ago
A Simple Flip-Flop Circuit for Typical-Case Designs for DFM
The deep submicron (DSM) semiconductor technologies will make the worst-case design impossible, since they can not provide design margins that it requires. Research directions sho...
Toshinori Sato, Yuji Kunitake
ISQED
2007
IEEE
128views Hardware» more  ISQED 2007»
13 years 11 months ago
A Model for Timing Errors in Processors with Parameter Variation
Parameter variation in integrated circuits causes sections of a chip to be slower than others. To prevent any resulting timing errors, designers have traditionally designed for th...
Smruti R. Sarangi, Brian Greskamp, Josep Torrellas
ISQED
2007
IEEE
166views Hardware» more  ISQED 2007»
13 years 11 months ago
Reducing the Energy Consumption in Fault-Tolerant Distributed Embedded Systems with Time-Constraint
In this paper we address the problem of reducing the energy consumption in distributed embedded systems associated with time-constraints and equipped with fault-tolerant technique...
Yuan Cai, Sudhakar M. Reddy, Bashir M. Al-Hashimi
ISQED
2007
IEEE
106views Hardware» more  ISQED 2007»
13 years 11 months ago
Passive Modeling of Interconnects by Waveform Shaping
In this paper, we propose a new approach to enforcing the passivity of a reduced system of general passive linear time invariant circuits. Instead of making the reduced models pas...
Boyuan Yan, Pu Liu, Sheldon X.-D. Tan, Bruce McGau...
ISQED
2007
IEEE
146views Hardware» more  ISQED 2007»
13 years 11 months ago
Parameter-Variation-Aware Analysis for Noise Robustness
This paper studies the impact of variability on the noise robustness of logic gates using noise rejection curves (NRCs). NRCs allow noise pulses to be modeled using magnitude-dura...
Mosin Mondal, Kartik Mohanram, Yehia Massoud
ISQED
2007
IEEE
125views Hardware» more  ISQED 2007»
13 years 11 months ago
Modeling of PMOS NBTI Effect Considering Temperature Variation
Negative bias temperature instability (NBTI) has come to the forefront of critical reliability phenomena in advanced CMOS technology. In this paper, we propose a fast and accurate...
Hong Luo, Yu Wang 0002, Ku He, Rong Luo, Huazhong ...
ISQED
2007
IEEE
134views Hardware» more  ISQED 2007»
13 years 11 months ago
Challenges in Evaluations for a Typical-Case Design Methodology
According to the current trend of increasing variations in process technologies and thus in performance, the conservative worst-case design will not work since design margins can ...
Yuji Kunitake, Akihiro Chiyonobu, Koichiro Tanaka,...