ISQED
2010
IEEE
13 years 11 months ago
2010
IEEE
Abstract— As the semiconductor technology continues its marching toward the deep sub-micron domain, the strong relation between leakage current and temperature becomes critical i...
ISQED
2010
IEEE
13 years 11 months ago
2010
IEEE
ISQED
2010
IEEE
13 years 11 months ago
2010
IEEE
—Negative Bias Temperature Instability (NBTI) is one of the major reliability problems in advanced technologies. NBTI causes threshold voltage degradation in a PMOS transistor wh...
ISQED
2010
IEEE
13 years 11 months ago
2010
IEEE
Leakage power has grown significantly and is a major challenge in SoC design. Among SoC's components, clock distribution network power accounts for a large portion of chip po...