ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
An area efficient and robust integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstructi...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
This paper describes the results of testing 50 single inline memory modules (SIMMs), each containing 16 16Mbit DRAM chips (DUTs); 39 SIMMs failed, and of the 800 DUTs, 116failed. ...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
A deterministic partitioning technique for fault diagnosis in Scan-Based BIST is proposed. Properties of high quality partitions for improved fault diagnosis times are identified...