ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
With increasing chip interconnect distances, openinterconnect is becoming an important defect. The main challenge with open-interconnects stems from its non-deterministic real-lif...
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
1 Scan based transition tests are added to improve the detection of speed failures using scan tests. Empirical data suggests that both data volume and application time, for transi...
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
ct Characterizing board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage, especially in a limited access testing environment that...
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
Efficient production testing is frequently hampered because current digital circuits require test sets which are too large. These test sets can be reduced significantly by means...