VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
With increasing circuit complexity and reliability requirements, screening outlier chips is an increasingly important test challenge. This is especially true for IDDQ test due to ...
DFT
2003
IEEE
13 years 10 months ago
2003
IEEE
Increased leakage and process variations make distinction between fault-free and faulty chips by IDDQ test difficult. Earlier the concept of Current Ratios (CR) was proposed to sc...