ICCAD
1995
IEEE
13 years 8 months ago
1995
IEEE
In this paper, a new approach to analog test design based on the circuit design process, called Characteristic Observation Inference (COI), is presented. In many situations, it is...
VLSID
2010
IEEE
13 years 8 months ago
2010
IEEE
We propose a method for diagnosis of parametric faults in analog circuits using polynomial coefficients of the circuit model [15]. As a sequel to our recent work [14], where circ...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
—A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit...