ICCAD
1996
IEEE
13 years 9 months ago
1996
IEEE
A scan-based BIST scheme is presented which guarantees complete fault coverage with very low hardware overhead. A probabilistic analysis shows that the output of an LFSR which fee...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson ...
GLVLSI
2003
IEEE
13 years 10 months ago
2003
IEEE
In this paper a novel reseeding architecture for scan-based BIST, which uses an LFSR as TPG, is proposed. Multiple cells of the LFSR are utilized as sources for feeding the scan c...
DAC
2000
ACM
14 years 5 months ago
2000
ACM