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ISQED
2007
IEEE
125views Hardware» more  ISQED 2007»
11 years 11 months ago
Modeling of PMOS NBTI Effect Considering Temperature Variation
Negative bias temperature instability (NBTI) has come to the forefront of critical reliability phenomena in advanced CMOS technology. In this paper, we propose a fast and accurate...
Hong Luo, Yu Wang 0002, Ku He, Rong Luo, Huazhong ...
ISQED
2008
IEEE
103views Hardware» more  ISQED 2008»
11 years 11 months ago
Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic Temperature Variation
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
Bin Zhang, Michael Orshansky
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