FDTC
2010
Springer
13 years 3 months ago
2010
Springer
The testability of the cryptographic cores brings in an extra dimension to the process of digital circuits testing
TC
2008
13 years 4 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
ITC
1992
IEEE
13 years 9 months ago
1992
IEEE
In this paper we report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations. Run times and success rates, i.e. t...
ICCAD
1997
IEEE
13 years 9 months ago
1997
IEEE
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...
ITC
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents a logic synthesis tool called BETSY (BIST Environment Testable Synthesis) for synthesizing circuits that achieve complete (100%)fault coverage in a user specif...
ISCAS
1999
IEEE
13 years 9 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
IOLTS
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulat...
DFT
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...