DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
We propose a new approach to test generation and test compaction for scan circuits that eliminates the distinction between scan operations and application of primary input vectors...
DSD
2005
IEEE
13 years 10 months ago
2005
IEEE
1 This paper presents a method for power-constrained system-on-chip test scheduling in an abort-on-first-fail environment where the test is terminated as soon as a fault is detecte...
DFT
2006
IEEE
13 years 11 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
HASE
2008
IEEE
13 years 11 months ago
2008
IEEE
Web applications often use dynamic pages that interact with each other by accessing shared objects, e.g., session objects. Interactions between dynamic pages need to be carefully ...