VTS
2000
IEEE
13 years 8 months ago
2000
IEEE
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
This paper proposes a new method based on analytic signal theory for extracting both instantaneous and RMS sinusoidal jitter from PLL output signals. The method relies on the exte...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
Delay defects can escape detection during the normal production test flow, particularly if they do not affect any of the long paths included in the test flow. Some defect types ca...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
Excessive switching activity during scan testing can cause average power dissipation and peak power during test to be much higher than during normal operation. This can cause prob...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
Hardware duplication techniques are widely used for concurrent error detection in dependable systems to ensure high availability and data integrity. These techniques are vulnerabl...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
Redundancy techniques are commonly used to design dependable systems to ensure high reliability, availability and data integrity. Triple Modular Redundancy (TMR) is a widely used ...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
Mixed-signal design and test tools are failing to keep apace with the increasing necessity for design exploration at the e arly stages.We outline a methodolo gy and toolset to ena...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
We present a low-cost on-line test methodology for RTL controller-datapath pairs, based on the notion of path invariance. The fundamental observation supporting the proposed metho...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
A novel design-for-test (DFT) technique is presented for designing a core with a “virtual scan chain” which looks (to the system integrator) like it is shorter than the real s...