Large-scale process variations can significantly limit the practical utility of microelectro-mechanical systems (MEMS) for RF (radio frequency) applications. In this paper we desc...
Fa Wang, Gokce Keskin, Andrew Phelps, Jonathan Rot...
Many state-of-the-art approaches on fault-tolerant system design make the simplifying assumption that all faults are detected within a certain time interval. However, based on a d...
Jia Huang, Kai Huang, Andreas Raabe, Christian Buc...
In this paper, we present a case study of our chip prototype of a 16-node 4x4 mesh NoC fabricated in 45nm SOI CMOS that aims to simultaneously optimize energy-latency-throughput f...
Sunghyun Park, Tushar Krishna, Chia-Hsin Owen Chen...
Due to the large geometry of through-silicon-vias (TSVs) and their connections to the power grid, significant current crowding can occur in 3D ICs. Prior works model TSVs and pow...
Powering down SDRAMs at run-time reduces memory energy consumption significantly, but often at the cost of performance. If employed speculatively with real-time memory controller...