—As circuits continue to scale to smaller feature sizes, wearout and latent defects are expected to cause an increasing number of errors in the field. Online error detection tec...
Nuno Alves, Y. Shi, N. Imbriglia, Jennifer Dworak,...
—The notion of Architectural Vulnerability Factor (AVF) has been extensively used by designers to evaluate various aspects of design robustness. While AVF is a very accurate way ...
—In-field diagnosability of electronic components in larger systems such as automobiles becomes a necessity for both customers and system integrators. Traditionally, functional ...
— Within-functional-block fine-grained adaptive dual supply voltage control (FADVC) is proposed to reduce the power of CMOS logic circuits. Both process and design variations wi...
We explore the suitability of Dolev-Yao-based attacker models for the security analysis of wireless communication. The Dolev-Yao model is commonly used for wireline and wireless ne...