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ETS
2011
IEEE
230views Hardware» more  ETS 2011»
14 years 6 months ago
Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis
—As circuits continue to scale to smaller feature sizes, wearout and latent defects are expected to cause an increasing number of errors in the field. Online error detection tec...
Nuno Alves, Y. Shi, N. Imbriglia, Jennifer Dworak,...
ETS
2011
IEEE
224views Hardware» more  ETS 2011»
14 years 6 months ago
AVF Analysis Acceleration via Hierarchical Fault Pruning
—The notion of Architectural Vulnerability Factor (AVF) has been extensively used by designers to evaluate various aspects of design robustness. While AVF is a very accurate way ...
Michail Maniatakos, Chandra Tirumurti, Abhijit Jas...
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ETS
2011
IEEE
220views Hardware» more  ETS 2011»
14 years 6 months ago
Structural In-Field Diagnosis for Random Logic Circuits
—In-field diagnosability of electronic components in larger systems such as automobiles becomes a necessity for both customers and system integrators. Traditionally, functional ...
Alejandro Cook, Melanie Elm, Hans-Joachim Wunderli...
ESSCIRC
2011
93views more  ESSCIRC 2011»
14 years 6 months ago
12% Power reduction by within-functional-block fine-grained adaptive dual supply voltage control in logic circuits with 42 volta
— Within-functional-block fine-grained adaptive dual supply voltage control (FADVC) is proposed to reduce the power of CMOS logic circuits. Both process and design variations wi...
Atsushi Muramatsu, Tadashi Yasufuku, Masahiro Nomu...
ESORICS
2011
Springer
14 years 6 months ago
Investigation of Signal and Message Manipulations on the Wireless Channel
We explore the suitability of Dolev-Yao-based attacker models for the security analysis of wireless communication. The Dolev-Yao model is commonly used for wireline and wireless ne...
Christina Pöpper, Nils Ole Tippenhauer, Boris...