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130

VLSID
1995
IEEE

112views VLSI» more VLSID 1995»

An efficient automatic test generation system for path delay faults in combinational circuits

15 years 8 months ago

An efficient automatic test generation system for path delay faults in combinational circuits

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Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...

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118

VLSID
1995
IEEE

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A VLSI architecture for the computation of NURBS patches

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A VLSI architecture for the computation of NURBS patches

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Meenakshisundaram Gopi, Swami Manohar

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115

VLSID
1995
IEEE

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Logic minimization based approach for compressing image data

15 years 8 months ago

Logic minimization based approach for compressing image data

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Jacob Augustine, Wen Feng, James Jacob

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157

VLDB
1995
ACM

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Eager Aggregation and Lazy Aggregation

15 years 8 months ago

Eager Aggregation and Lazy Aggregation

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Efficient processing of aggregation queries is essential for decision support applications. This paper describes a class of query transformations, called eager aggregation and lat...

Weipeng P. Yan, Per-Åke Larson

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133

VLDB
1995
ACM

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OODB Bulk Loading Revisited: The Partitioned-List Approach

15 years 8 months ago

OODB Bulk Loading Revisited: The Partitioned-List Approach

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Object-oriented and object-relational databases(OODB) need to be able to load the vast quantities of data that OODB users bring to them. Loading OODB datais significantly more com...

Janet L. Wiener, Jeffrey F. Naughton

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