151
click to vote
DATE
2009
IEEE
15 years 8 months ago
2009
IEEE
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse consequences on design predictability and yield. A number of recent works have...
127
click to vote
DATE
2009
IEEE
15 years 8 months ago
2009
IEEE
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...
147
click to vote
DATE
2009
IEEE
15 years 8 months ago
2009
IEEE
As application complexity increases, modern embedded systems have adopted heterogeneous processing elements to enhance the computing capability or to reduce the power consumption. ...
DATE
2009
IEEE
15 years 8 months ago
2009
IEEE
129
click to vote
DATE
2009
IEEE
15 years 8 months ago
2009
IEEE
Abstract--Hardware/Software codesign of Elliptic Curve Cryptography has been extensively studied in recent years. However, most of these designs have focused on the computational a...