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156
Voted
ISCA
2010
IEEE
199views Hardware» more  ISCA 2010»
15 years 10 months ago
Use ECP, not ECC, for hard failures in resistive memories
As leakage and other charge storage limitations begin to impair the scalability of DRAM, non-volatile resistive memories are being developed as a potential replacement. Unfortunat...
Stuart E. Schechter, Gabriel H. Loh, Karin Straus,...
CALCO
2007
Springer
129views Mathematics» more  CALCO 2007»
15 years 10 months ago
CIRC : A Circular Coinductive Prover
Abstract. CIRC is an automated circular coinductive prover implemented as an extension of Maude. The circular coinductive technique that forms the core of CIRC is discussed, togeth...
Dorel Lucanu, Grigore Rosu
CALCO
2007
Springer
135views Mathematics» more  CALCO 2007»
15 years 10 months ago
Specification-Based Testing for CoCasl's Modal Specifications
Specification-based testing is a particular case of black-box testing, which consists in deriving test cases from an analysis of a formal specification. We present in this paper an...
Delphine Longuet, Marc Aiguier
CCA
2009
Springer
15 years 10 months ago
On the Computability of Rectifiable Simple Curve (Extended Abstract)
d Abstract) Robert Rettinger1 and Xizhong Zheng2,3 1 Lehrgebiet Algorithmen und Komplexit
Robert Rettinger, Xizhong Zheng
CAISE
2007
Springer
15 years 10 months ago
Formalization and Verification of EPCs with OR-Joins Based on State and Context
The semantics of the OR-join in business process modeling languages like EPCs or YAWL have been discussed for a while. Still, the existing solutions suffer from at least one of two...
Jan Mendling, Wil M. P. van der Aalst