177
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ASPDAC
2007
ACM
15 years 10 months ago
2007
ACM
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
186
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ASPDAC
2007
ACM
15 years 10 months ago
2007
ACM
- This paper presents a real time programmable irregular Low Density Parity Check (LDPC) Encoder as specified in the IEEE P802.16E/D7 standard. The encoder is programmable for fram...
ASPDAC
2007
ACM
15 years 10 months ago
2007
ACM
169
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ASPDAC
2007
ACM
15 years 10 months ago
2007
ACM
- This paper proposes a fast and practical decoupling capacitor (decap) budgeting algorithm to optimize the power ground (P/G) network design. The new method adopts a modified rand...
149
click to vote
ASPDAC
2007
ACM
15 years 10 months ago
2007
ACM
- We present a bus arbitration scheme for soft real-time constrained embedded systems. Some masters in such systems are required to complete their work for given timing constraints...