153
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ASPDAC
2007
ACM
15 years 10 months ago
2007
ACM
As integrated circuits manufacturing technology is advancing into 65nm and 45nm nodes, extensive resolution enhancement techniques (RETs) are needed to correctly manufacture a chip...
160
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ASPDAC
2007
ACM
15 years 10 months ago
2007
ACM
With aggressive scaling down of feature sizes in VLSI fabrication, process variation has become a critical issue in designs. We show that two necessary conditions for the "Ma...
ASPDAC
2007
ACM
15 years 10 months ago
2007
ACM
