Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
Off-chip decoupling capacitor (decap) allocation is a demanding task during package and chip codesign. Existing approaches can not handle large numbers of I/O counts and large num...
Satisfiability (SAT) solvers often benefit from a preprocessing of the formula to be decided. For formulae in conjunctive normal form (CNF), subsumed clauses may be removed or par...
Processing and storage of confidential or critical information is an every day occurrence in computing systems. The trustworthiness of computing devices has become an important co...
Due to high levels of integration and complexity, the design of multi-core SoCs has become increasingly challenging. In particular, energy consumption and distributing a single gl...