Sciweavers

DAC
2007
ACM
16 years 8 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DAC
2007
ACM
16 years 8 months ago
Off-chip Decoupling Capacitor Allocation for Chip Package Co-Design
Off-chip decoupling capacitor (decap) allocation is a demanding task during package and chip codesign. Existing approaches can not handle large numbers of I/O counts and large num...
Hao Yu, Chunta Chu, Lei He
DAC
2007
ACM
16 years 8 months ago
Alembic: An Efficient Algorithm for CNF Preprocessing
Satisfiability (SAT) solvers often benefit from a preprocessing of the formula to be decided. For formulae in conjunctive normal form (CNF), subsumed clauses may be removed or par...
HyoJung Han, Fabio Somenzi
DAC
2007
ACM
16 years 8 months ago
Trusted Hardware: Can It Be Trustworthy?
Processing and storage of confidential or critical information is an every day occurrence in computing systems. The trustworthiness of computing devices has become an important co...
Cynthia E. Irvine, Karl N. Levitt
DAC
2007
ACM
16 years 8 months ago
Voltage-Frequency Island Partitioning for GALS-based Networks-on-Chip
Due to high levels of integration and complexity, the design of multi-core SoCs has become increasingly challenging. In particular, energy consumption and distributing a single gl...
Ümit Y. Ogras, Diana Marculescu, Puru Choudha...