175
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DAC
2008
ACM
16 years 8 months ago
2008
ACM
In deep submicron circuits, thermal hot spots and high temperature gradients increase the cooling costs, and degrade reliability and performance. In this paper, we propose a low-co...
161
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DAC
2008
ACM
16 years 8 months ago
2008
ACM
FPGA application developers often attempt to use pipelining, Cslowing and retiming to improve the performance of their designs. Unfortunately, such registered netlists present a f...
183
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DAC
2008
ACM
16 years 8 months ago
2008
ACM
This paper presents a RTR FPGA embedded in a System on Chip fabricated in 130nm CMOS process. Various aspects of the design flow, from automation to floor-planning are discussed. ...
226
Voted
DAC
2008
ACM
16 years 8 months ago
2008
ACM
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
189
click to vote
DAC
2008
ACM
16 years 8 months ago
2008
ACM
As integrated circuit technology plumbs ever greater depths in the scaling of feature sizes, maintaining the paradigm of deterministic Boolean computation is increasingly challeng...