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Publication
576views
17 years 2 months ago
Within-die Process Variations: How Accurately can They Be Statistically Modeled?
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
Brendan Hargreaves, Henrik Hult, Sherief Reda

Lecture Notes
889views
17 years 2 months ago
Future Directions in Computing
Silicon-based electronics is the foundation of computing devices. The computer industry is reaching an important milestone, where physical limits arising from using optical lithogr...
Sherief Reda
ICDE
2008
IEEE
425views Database» more  ICDE 2008»
17 years 2 months ago
NAGA: Searching and Ranking Knowledge
The Web has the potential to become the world’s largest knowledge base. In order to unleash this potential, the wealth of information available on the Web needs to be extracte...
Gjergji Kasneci, Fabian M. Suchanek, Georgiana Ifr...
ICDE
2009
IEEE
1081views Database» more  ICDE 2009»
17 years 2 months ago
Modeling and Integrating Background Knowledge in Data Anonymization
Recent work has shown the importance of considering the adversary’s background knowledge when reasoning about privacy in data publishing. However, it is very difficult for the d...
Tiancheng Li, Ninghui Li, Jian Zhang
ICDE
2008
IEEE
498views Database» more  ICDE 2008»
17 years 2 months ago
Injector: Mining Background Knowledge for Data Anonymization
Existing work on privacy-preserving data publishing cannot satisfactorily prevent an adversary with background knowledge from learning important sensitive information. The main cha...
Tiancheng Li, Ninghui Li