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WSCG
2001

An Alternative Approach for Pattern Detection Applied to Materials Characterization

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An Alternative Approach for Pattern Detection Applied to Materials Characterization
The problem of detecting specific patterns in images of materials obtained through High Resolution Transmission Electron Microscopy is addressed. A supervised classification method is proposed using an extension of Principal Component Analysis and a new a procedure for building the training set. Experiments on two different types of images indicate that the proposed method is superior to the conventional cross-correlation approach. Moreover, using the same number of components, the new dimensionality reduction approach shows a better performance than the standard PCA method.
Raul Queiroz Feitosa, Guilherme Lúcio Abelh
Added 31 Oct 2010
Updated 31 Oct 2010
Type Conference
Year 2001
Where WSCG
Authors Raul Queiroz Feitosa, Guilherme Lúcio Abelha Mota, Sidnei Paciornik
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