Sciweavers

ET
2006

Automatic Test Pattern Generation for Resistive Bridging Faults

13 years 7 months ago
Automatic Test Pattern Generation for Resistive Bridging Faults
An ATPG for resistive bridging faults is proposed that combines the advantages of section-based generation and interval-based simulation. In contrast to the solutions introduced so far, it can handle arbitrary non-feedback bridges between two nodes, including ones detectable at higher resistance and undetectable at lower resistance, and faults requiring more than one vector for detection.
Piet Engelke, Ilia Polian, Michel Renovell, Bernd
Added 12 Dec 2010
Updated 12 Dec 2010
Type Journal
Year 2006
Where ET
Authors Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker
Comments (0)