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DATE
2010
IEEE

BISD: Scan-based Built-In self-diagnosis

14 years 17 days ago
BISD: Scan-based Built-In self-diagnosis
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may be necessary to apply additional deterministic patterns, which cause additional hardware costs. Secondly, the BIST-signature reveals only poor diagnostic information. Recently, the first issue has been addressed successfully. The paper at hand proposes a viable, effective and cost efficient solution for the second problem. The paper presents a new method for Built-In Self-Diagnosis (BISD). The core of the method is an extreme response compaction architecture, which for the first time enables an autonomous on-chip evaluation of test responses with negligible hardware overhead. The key advantage of this architecture is that all data, which is relevant for a subsequent diagnosis, is gathered during just one test session. The BISD method comprises a hardware scheme, a test pattern generation approach and a di...
Melanie Elm, Hans-Joachim Wunderlich
Added 10 Jul 2010
Updated 10 Jul 2010
Type Conference
Year 2010
Where DATE
Authors Melanie Elm, Hans-Joachim Wunderlich
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