CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns

CASP, Concurrent Autonomous chip self-test using Stored test Patterns, is a special kind of self-test where a system tests itself concurrently during normal operation without any downtime visible to the end-user. CASP consists of two ideas:

• Type: Conference
• Year: 2008
• Where: DATE
• Authors: Yanjing Li, Samy Makar, Subhasish Mitra
• Keywords: Autonomous Chip Self-test, CASP, DATE 2008, Hardware, Stored Test Patterns