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    GLVLSI
    1998
    IEEE
    83views VLSI» more  GLVLSI 1998»

    A Design-for-Testability Technique for Detecting Delay Faults in Logic Circuits

    15 years 1 months ago
    A Design-for-Testability Technique for Detecting Delay Faults in Logic Circuits
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    Kaamran Raahemifar, Majid Ahmadi
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    Added 04 Aug 2010
    Updated 04 Aug 2010
    Type Conference
    Year 1998
    Where GLVLSI
    Authors Kaamran Raahemifar, Majid Ahmadi
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