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CVPR
2006
IEEE

Diffusion Distance for Histogram Comparison

15 years 2 days ago
Diffusion Distance for Histogram Comparison
In this paper we propose diffusion distance, a new dissimilarity measure between histogram-based descriptors. We define the difference between two histograms to be a temperature field. We then study the relationship between histogram similarity and a diffusion process, showing how diffusion handles deformation as well as quantization effects. As a result, the diffusion distance is derived as the sum of dissimilarities over scales. Being a cross-bin histogram distance, the diffusion distance is robust to deformation, lighting change and noise in histogram-based local descriptors. In addition, it enjoys linear computational complexity which significantly improves previously proposed cross-bin distances with quadratic complexity or higher. We tested the proposed approach on both shape recognition and interest point matching tasks using several multi-dimensional histogram-based descriptors including shape context, SIFT, and spin images. In all experiments, the diffusion distance performs ...
Haibin Ling, Kazunori Okada
Added 12 Oct 2009
Updated 28 Oct 2009
Type Conference
Year 2006
Where CVPR
Authors Haibin Ling, Kazunori Okada
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