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72

ITC
2002
IEEE

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Embedded Deterministic Test for Low-Cost Manufacturing Test

15 years 3 months ago

Embedded Deterministic Test for Low-Cost Manufacturing Test

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Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan

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Added	15 Jul 2010
Updated	15 Jul 2010
Type	Conference
Year	2002
Where	ITC
Authors	Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian

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