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81

IEICET
2008

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On Fault Testing for Reversible Circuits

15 years 2 months ago

On Fault Testing for Reversible Circuits

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Satoshi Tayu, Shigeru Ito, Shuichi Ueno

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Added	11 Dec 2010
Updated	11 Dec 2010
Type	Journal
Year	2008
Where	IEICET
Authors	Satoshi Tayu, Shigeru Ito, Shuichi Ueno

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