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88

VLSID
1995
IEEE

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Functional test generation for non-scan sequential circuits

15 years 6 months ago

Functional test generation for non-scan sequential circuits

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Mandyam-Komar Srinivas, James Jacob, Vishwani D. A

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VLSI | VLSID 1995 |

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More Details (n/a)

Added	26 Aug 2010
Updated	26 Aug 2010
Type	Conference
Year	1995
Where	VLSID
Authors	Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal

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