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ITC
1996
IEEE

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Identification and Test Generation for Primitive Faults

15 years 10 months ago

Identification and Test Generation for Primitive Faults

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Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakrad

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Hardware | ITC 1996 |

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Added	07 Aug 2010
Updated	07 Aug 2010
Type	Conference
Year	1996
Where	ITC
Authors	Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakradhar

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