Sciweavers

11
Voted
DATE
2008
IEEE

Multi-Vector Tests: A Path to Perfect Error-Rate Testing

14 years 19 days ago
Multi-Vector Tests: A Path to Perfect Error-Rate Testing
The importance of testing approaches that exploit error tolerance to improve yield has previously been established. Error rate, defined as the percentage of vectors for which the value at a circuit’s output deviates from the corresponding error-free value, has been identified as a key metric for severity. In error-rate testing every chip that has an error rate greater than or equal to a threshold specified by the application is unacceptable for the application and discarded; all other chips are acceptable. The objective of error-rate testing is to reject every unacceptable chip while accepting all (or a maximum number) of the acceptable chips. We previously showed that it is not always possible to generate a test set that detects all unacceptable faults, i.e., faults that cause an error rate greater than or equal to the threshold error rate, without detecting some of the acceptable faults, i.e., faults that cause an error rate less than the threshold. In this paper, we introduce ...
Shideh Shahidi, Sandeep Gupta
Added 29 May 2010
Updated 29 May 2010
Type Conference
Year 2008
Where DATE
Authors Shideh Shahidi, Sandeep Gupta
Comments (0)