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CORR
2007
Springer

Parametric Yield Analysis of Mems via Statistical Methods

14 years 1 hour ago
Parametric Yield Analysis of Mems via Statistical Methods
This paper considers a developing theory on the effects of inevitable process variations during the fabrication of MEMS and other microsystems. The effects on the performance and design yield of the microsystems devices are analyzed and presented. A novel methodology in the design cycle of MEMS and other microsystems is briefly introduced. This paper describes the initial steps of this methodology that is aimed at counteracting the parametric variations in the product cycle of microsystems. It is based on a concept of worst-case analysis that has proven successful in the parent IC gy. Issues ranging from the level of abstraction of the microsystem models to the availability of such models are addressed. Key words: MEMS, process variations, Monte Carlo analysis, worst-case analysis and model order reduction.
Shyam Praveen Vudathu, Kishore K. Duganapalli, Rai
Added 13 Dec 2010
Updated 13 Dec 2010
Type Journal
Year 2007
Where CORR
Authors Shyam Praveen Vudathu, Kishore K. Duganapalli, Rainer Laur, D. Kubalinska, Angelika Bunse-Gerstner
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