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JETC
2008

Parametric yield management for 3D ICs: Models and strategies for improvement

13 years 5 months ago
Parametric yield management for 3D ICs: Models and strategies for improvement
Cesare Ferri, Sherief Reda, R. Iris Bahar
Added 13 Dec 2010
Updated 13 Dec 2010
Type Journal
Year 2008
Where JETC
Authors Cesare Ferri, Sherief Reda, R. Iris Bahar
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