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ISQED
2005
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Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning
14 years 3 months ago
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online.sfsu.edu
Swarup Bhunia, Hamid Mahmoodi-Meimand, Debjyoti Gh
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Added
25 Jun 2010
Updated
25 Jun 2010
Type
Conference
Year
2005
Where
ISQED
Authors
Swarup Bhunia, Hamid Mahmoodi-Meimand, Debjyoti Ghosh, Kaushik Roy
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