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    GLVLSI
    1999
    IEEE
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    Pseudo-Exhaustive Testing of Sequential Circuits

    15 years 7 months ago
    Pseudo-Exhaustive Testing of Sequential Circuits
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    Bassam Shaer, Sami A. Al-Arian, David L. Landis
    claim paper
    Added 03 Aug 2010
    Updated 03 Aug 2010
    Type Conference
    Year 1999
    Where GLVLSI
    Authors Bassam Shaer, Sami A. Al-Arian, David L. Landis
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