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166

ICCAD
1993
IEEE

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Reconfigurable scan chains: a novel approach to reduce test application time

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Reconfigurable scan chains: a novel approach to reduce test application time

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Sridhar Narayanan, Melvin A. Breuer

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Added	08 Aug 2010
Updated	08 Aug 2010
Type	Conference
Year	1993
Where	ICCAD
Authors	Sridhar Narayanan, Melvin A. Breuer

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