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    ASPDAC
    2008
    ACM
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    On reducing both shift and capture power for scan-based testing

    15 years 4 months ago
    On reducing both shift and capture power for scan-based testing
    Download  www.cse.cuhk.edu.hk
    Jia Li, Qiang Xu, Yu Hu, Xiaowei Li
    claim paper
    Added 12 Oct 2010
    Updated 12 Oct 2010
    Type Conference
    Year 2008
    Where ASPDAC
    Authors Jia Li, Qiang Xu, Yu Hu, Xiaowei Li
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