Sciweavers

ET
2007

Reliability and Defect Tolerance in Metallic Quantum-dot Cellular Automata

13 years 5 months ago
Reliability and Defect Tolerance in Metallic Quantum-dot Cellular Automata
The computational paradigm known as quantum-dot cellular automata (QCA) encodes binary information in the charge configuration of Coulomb-coupled quantum-dot cells. Functioning QCA devices made of metal-dot cells have been fabricated and measured. We focus here on the issue of robustness in the presence of disorder and thermal fluctuations. We examine the performance of a semi-infinite QCA shift register as a function of both clock period and temperature. The existence of power gain in QCA cells acts to restore signal levels even in situations where high speed operation and high temperature operation threaten signal stability. Random variations in capacitance values can also be tolerated.
Mo Liu, Craig S. Lent
Added 14 Dec 2010
Updated 14 Dec 2010
Type Journal
Year 2007
Where ET
Authors Mo Liu, Craig S. Lent
Comments (0)