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DAC
2009
ACM

On systematic illegal state identification for pseudo-functional testing

14 years 6 months ago
On systematic illegal state identification for pseudo-functional testing
The discrepancy between integrated circuits' activities in normal functional mode and that in structural test mode has an increasing adverse impact on the effectiveness of manufacturing test. Pseudofunctional testing tries to resolve this problem by identifying illegal states in functional mode and avoiding them during the test pattern generation process. Existing methods, however, can only extract a small set of illegal states in the system due to various limitations. In this paper, we first show that illegal states in the system are mainly caused by multi-fanout nets in the circuit, and we develop efficient and effective heuristics to identify them. Experimental results on benchmark circuits demonstrate the effectiveness of our proposed systematic solution. Categories and Subject Descriptors B.7.3 [Integrated Circuits]: Reliability and Testing General Terms Reliability, Design. Keywords Pseudo-Functional Testing, Illegal States
Feng Yuan, Qiang Xu
Added 12 Nov 2009
Updated 12 Nov 2009
Type Conference
Year 2009
Where DAC
Authors Feng Yuan, Qiang Xu
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