1034 search results - page 101 / 207 » A Bayesian Metric for Evaluating Machine Learning Algorithms |
DAC
2003
ACM
15 years 10 months ago
2003
ACM
The use of Support Vector Machines (SVMs) to represent the performance space of analog circuits is explored. In abstract terms, an analog circuit maps a set of input design parame...
ICML
2001
IEEE
15 years 10 months ago
2001
IEEE
In this paper, we discuss a technique for handling multi-class problems with binary classifiers, namely to learn one classifier for each pair of classes. Although this idea is kno...
ICML
2005
IEEE
15 years 10 months ago
2005
IEEE
We introduce a Bayesian model, BayesANIL, that is capable of estimating uncertainties associated with the labeling process. Given a labeled or partially labeled training corpus of...
ICRA
2010
IEEE
14 years 8 months ago
2010
IEEE
Abstract— The need for efficient monitoring of spatiotemporal dynamics in large environmental surveillance applications motivates the use of robotic sensors to achieve sufficie...
FUIN
2010
14 years 4 months ago
2010
Feature selection is an important preprocessing step in pattern analysis and machine learning. The key issue in feature selection is to evaluate quality of candidate features. In t...