1660 search results - page 128 / 332 » A Behavior Model for Next Generation Test Systems |
136
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DATE
2006
IEEE
15 years 4 months ago
2006
IEEE
same level of system-level CAD support that is now commonplace in the IC industry.Recent advances in microfluidics are expected to lead to sensor systems for high-throughput bioche...
DATE
2005
IEEE
15 years 3 months ago
2005
IEEE
Technology Roadmap for Semiconductors (ITRS) clearly identifies the integration of electrochemical and electrobiological techniques as one of the system-level design challenges tha...
127
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TAOSD
2010
14 years 4 months ago
2010
The idea behind Aspect-Oriented Modeling (AOM) is to apply aspect-oriented techniques to (software) models with the aim of modularizing crosscutting concerns. This can be done with...
110
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MBEES
2008
14 years 11 months ago
2008
: In this paper, we discuss adjustable coverage criteria and their combinations in model-based testing. We formalize coverage criteria and specify test goals using OCL. Then, we pr...
DATE
2003
IEEE
15 years 3 months ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...