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» A Behavior Model for Next Generation Test Systems
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ATS
2010
IEEE
229views Hardware» more  ATS 2010»
14 years 8 months ago
Variation-Aware Fault Modeling
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
Fabian Hopsch, Bernd Becker, Sybille Hellebrand, I...
IVA
2007
Springer
15 years 4 months ago
Incorporating Emotion Regulation into Virtual Stories
This paper presents an approach to incorporate emotion regulation as addressed within psychology literature into virtual characters. To this end, first Gross’ informal theory of ...
Tibor Bosse, Matthijs Pontier, Ghazanfar F. Siddiq...
PDCN
2004
14 years 11 months ago
Ontoenvironment: An integration infrastructure for distributed heterogeneous resources
A new age of heterogeneous resource integration has begun. Next generation of integration systems will utilize different methods and techniques to achieve the vision of ubiquitous...
Oleksiy Khriyenko, Oleksandr Kononenko, Vagan Y. T...
MEMOCODE
2007
IEEE
15 years 4 months ago
Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
Stephan Eggersglüß, Görschwin Fey,...
IADIS
2003
14 years 11 months ago
A Facial Expression Analysis Component for Affective Tutoring Systems
Intelligent tutoring systems (ITS) provide individualised instruction. They offer many advantages over the traditional classroom scenario: they are always available, non-judgement...
Scott P. Overmyer, Hamid Gholam Hosseini, Chao Fan...