Sciweavers

1660 search results - page 21 / 332
» A Behavior Model for Next Generation Test Systems
Sort
View
DAC
2002
ACM
15 years 10 months ago
The next chip challenge: effective methods for viable mixed technology SoCs
The next generation of computer chips will continue the trend for more complexity than their predecessors. Many of them will contain different chip technologies and are termed SoC...
H. Bernhard Pogge
PTS
1998
81views Hardware» more  PTS 1998»
14 years 11 months ago
Testing Temporal Logic Properties in Distributed Systems
Based on the notion of event-based behavioral abstraction EBBA we specify properties of object-oriented distributed systems in linear time temporal logic. These properties are the...
Falk Dietrich, Xavier Logean, Shawn Koppenhoefer, ...
HIS
2008
14 years 11 months ago
Artificial Data Sets Based on Knowledge Generators: Analysis of Learning Algorithms Efficiency
This paper proposes a methodology to generate artificial data sets to evaluate the behavior of machine learning techniques. The methodology relies in the definition of a domain an...
Joaquin Rios-Boutin, Albert Orriols-Puig, Josep Ma...
SPIN
2005
Springer
15 years 3 months ago
Execution Generated Test Cases: How to Make Systems Code Crash Itself
Abstract. This paper presents a technique that uses code to automatically generate its own test cases at run-time by using a combination of symbolic and concrete (i.e., regular) ex...
Cristian Cadar, Dawson R. Engler
JAVACARD
2000
15 years 1 months ago
Automatic Test Generation for Java-Card Applets
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
Hugues Martin, Lydie du Bousquet