Sciweavers

1660 search results - page 24 / 332
» A Behavior Model for Next Generation Test Systems
Sort
View
ACSD
2001
IEEE
102views Hardware» more  ACSD 2001»
15 years 1 months ago
Exploration Testing
This paper describes a new way of testing reactive systems as investigated by the RATE-project at the Tampere University of Technology. We abandon the idea of systematically using...
Juhana Helovuo, Sari Leppänen
ISNN
2005
Springer
15 years 3 months ago
Application of Neural Networks for Very Short-Term Load Forecasting in Power Systems
Load forecasting has become in recent years one of the major areas of research in electrical engineering. In a deregulated, competitive power market, utilities tend to maintain the...
Hungcheng Chen, Kuohua Huang, Lungyi Chang
96
Voted
APSEC
2009
IEEE
14 years 7 months ago
A Formal Framework to Integrate Timed Security Rules within a TEFSM-Based System Specification
Abstract--Formal methods are very useful in software industry and are becoming of paramount importance in practical engineering techniques. They involve the design and the modeling...
Wissam Mallouli, Amel Mammar, Ana R. Cavalli
ITC
1997
IEEE
119views Hardware» more  ITC 1997»
15 years 1 months ago
Testability Analysis and ATPG on Behavioral RT-Level VHDL
This paper proposes an environment to address Testability Analysis and Test Pattern Generation on VHDL descriptions at the RT-level. The proposed approach, based on a suitable fau...
Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda
ISSTA
2009
ACM
15 years 4 months ago
Precise pointer reasoning for dynamic test generation
Dynamic test generation consists of executing a program while gathering symbolic constraints on inputs from predicates encountered in branch statements, and of using a constraint ...
Bassem Elkarablieh, Patrice Godefroid, Michael Y. ...