4 search results - page 1 / 1 » A Behavior-Level Fault Model for the Closed-Loop Operational... |
JISE
2000
13 years 6 months ago
2000
ITC
1996
IEEE
13 years 10 months ago
1996
IEEE
common use is the distinction into two (abstract) fault models: A new fault modelling scheme for integrated analogue general the "Single Hard Fault Model (SHFM)" and the ...
DATE
1999
IEEE
13 years 10 months ago
1999
IEEE
This work presents a new diagnosis method for use in an adaptive analog tester. The tester is able to detect faults in any linear circuit by learning a reference behavior in a fir...
PRDC
2007
IEEE
14 years 20 days ago
2007
IEEE
This paper assesses message missing failures in a FlexRay-based network. The assessment is based on about 35680 bit-flip fault injections inside different parts of the FlexRay com...