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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
15 years 8 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
IJCAI
2003
15 years 6 months ago
Integrating Background Knowledge Into Text Classification
We present a description of three different algorithms that use background knowledge to improve text classifiers. One uses the background knowledge as an index into the set of tra...
Sarah Zelikovitz, Haym Hirsh
BMCBI
2006
154views more  BMCBI 2006»
15 years 5 months ago
Automated recognition of malignancy mentions in biomedical literature
Background: The rapid proliferation of biomedical text makes it increasingly difficult for researchers to identify, synthesize, and utilize developed knowledge in their fields of ...
Yang Jin, Ryan T. McDonald, Kevin Lerman, Mark A. ...
ENTCS
2006
146views more  ENTCS 2006»
15 years 5 months ago
Relating State-Based and Process-Based Concurrency through Linear Logic
This paper has the purpose of reviewing some of the established relationships between logic and concurrency, and of exploring new ones. Concurrent and distributed systems are noto...
Iliano Cervesato, Andre Scedrov
IJVR
2006
199views more  IJVR 2006»
15 years 4 months ago
Interactive Virtual Humans in Real-Time Virtual Environments
In this paper, we will present an overview of existing research in the vast area of IVH systems. We will also present our ongoing work on improving the expressive capabilities of I...
Nadia Magnenat-Thalmann, Arjan Egges
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