1002 search results - page 16 / 201 » A Computer Aided Grading System for Subjective Tests |
DAC
2010
ACM
15 years 1 months ago
2010
ACM
Post-silicon validation is used to detect and fix bugs in integrated circuits and systems after manufacture. Due to sheer design complexity, it is nearly impossible to detect and ...
DMIN
2006
14 years 11 months ago
2006
- Filtering the immense amount of data available electronically over the World Wide Web is an important task of search engines in data mining applications. Users when performing se...
SEDE
2007
14 years 11 months ago
2007
— Achieving reliability in fault tolerant systems requires both avoidance and redundancy. This study focuses on avoidance as it pertains to the design of microchips. The lifecycl...
DAC
2002
ACM
15 years 10 months ago
2002
ACM
We propose a false-path-aware statistical timing analysis framework. In our framework, cell as well as interconnect delays are assumed to be correlated random variables. Our tool ...
JCDL
2004
ACM
15 years 3 months ago
2004
ACM
We have developed MetaExtract, a system to automatically assign Dublin Core + GEM metadata using extraction techniques from our natural language processing research. MetaExtract i...