This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K t...
Graham Hetherington, Tony Fryars, Nagesh Tamarapal...
The automatic parallelization of C has always been frustrated by pointer arithmetic, irregular control flow and complicated data aggregation. Each of these problems is similar to f...
Aspect mining tries to identify crosscutting concerns in the code of existing systems and thus supports their adaption to an aspect-oriented design. A semi-automatic static aspect...
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
Dinos Moundanos, Jacob A. Abraham, Yatin Vasant Ho...
Regression test prioritization techniques re-order the execution of a test suite in an attempt to ensure that defects are revealed earlier in the test execution phase. In prior wo...
Matthew J. Rummel, Gregory M. Kapfhammer, Andrew T...